منابع مشابه
Parallel Beam Powder Diffractometry Using a Laboratory X-Ray Source
We report on the application of a new, non-dispersive double multilayer optical arrangement to prepare a parallel beam from a laboratory x-ray source for standardization of powder diffraction reference materials and the associated high accuracy diffractometer. The beam preparation optic uses a graded-spacing parabolic multilayer to gather radiation from a small focus x-ray source and a subseque...
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Monoenergetic x-ray diffraction (XRD) analysis is an established standard for the assessment of urinary stone composition. The inherent low energy of x-rays used (8 keV), however, restricts penetration depth and imposes a requirement for small powdered samples. A technique capable of producing detailed information regarding component structural arrangements in calculi non-destructively would pr...
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The quantitative mineralogical analysis of small samples (less than 20 mg) of china clay has been investigated using x ray diffractometry to determine kaolinite, mica, quartz, and feldspar. A method has been developed and applied to the quantitative analysis of airborne dust samples and of other small discrete samples. Determinations were made either on samples after collection on a membrane fi...
متن کاملUse of X-Ray Diffractometry (XRD) for Identification of Fritillaria According to Geographical Origin
Fritillaria is a traditional Chinese herbal medicine for anti-tussive and expectorant use in China and some other Asian countries. The Fritillaria Chinese medicine material derived from different geographical origins is always difficult to discriminate each other. The objective of the study is to develop a nondestructive and simple method to identify five Fritillaria Chinese materia medica such...
متن کاملX-ray diffractometry for the structure determination of a submicrometre single powder grain
A high-precision diffractometer has been developed for the structure analysis of a submicrometre-scale single grain of a powder sample at the SPring-8 BL40XU undulator beamline. The key design concept is the combination of a stable focused synchrotron radiation beam and the precise axis control of the diffractometer, which allows accurate diffraction intensity data of a submicrometre-scale sing...
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ژورنال
عنوان ژورنال: Acta Crystallographica Section A Foundations of Crystallography
سال: 1987
ISSN: 0108-7673
DOI: 10.1107/s0108767387079352